Showing results: 2356 - 2370 of 5362 items found.
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Accel-RF Corporation
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Noisecom
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.
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VLMS -
G Systems, l.p.
The G Systems Valve Leak Measurement System (VLMS) reliably measures slow leaks that are unidentifiable with conventional leak detectors, helping manufacturers test and ensure that critical valves are absolutely airtight. The G Systems VLMS is a self-contained counting instrument for automating the industry-standard practice of leak detection by bubble formation using a submerged tube in water. The G Systems VLMS provides accurate measurement of leaks that are too small for conventional flow meters to reliably detect and is ideal for applications that must be absolutely airtight, including medical device, pharmaceutical, oil and gas, and plumbing valves.
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MS 1303 -
Meltronics Systemtech
The Railway signaling unit is used to receive the input signals from the field for validating and clearing route for trains. After receiving the signals, signals are isolated and various tests are done inside the system to ensure the received signals reliability and produce clearance signal to railway line. For security reasons card signature has been given to each card in the system. System consists of digital input modules, digital output module, digital read back module, RS232 interface with 80486 processor board. It is an ISA Bus Back plane based system.
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ABex Switching -
Konrad Technologies GmbH
The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
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National Technical Systems
Forced entry testing is conducted on building envelope and system components such as doors, windows, wall panels and escape hatches as an attempt to penetrate or distort an edge in order to disengage a fitting or device from its mountings and allow access. The US Department of State has developed a standard that all building envelope and system components used in both domestic security and overseas facilities are required to achieve. NTS conducts all forced entry test in their DOS approved facility in accordance to the SD-STD-01.01 standard. All testing is witnessed by DOS personnel with NTS providing reports on all tests performed.
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FTBx-3500 -
EXFO Inc.
Network equipment manufacturers and transceiver manufacturers know that variable attenuators are essential components of their test systems. They look for performance, user-friendliness, complete control of test parameters and advanced programming capability. EXFO’s FTBx-3500 Variable Attenuator combines innovative design techniques, high-quality components and meticulous calibration procedure. Ideal for bit error rate testing and system verification, the FTBx-3500 is the only variable optical attenuator (VOA) that offers a fully remote user interface (UI) and EXFO Multilink compatibility. It is also the only VOA on the market to offer a benchtop unit, which can be controlled remotely or using a touchscreen.
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785855-01 -
NI
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Konica Minolta Sensing Americas, Inc
Radiant Vision Systems engineers advanced imaging systems to critically evaluate light, color, manufacturing integrity, and surface quality of illuminated displays and device assemblies. World leaders in manufacturing rely on Radiant Vision Systems for test and measurement solutions that ensure quality, reduce costs, and improve efficiencies. Radiant products include TrueTest™ Automated Visual Inspection systems for measurement and control, ProMetric® Imaging Colorimeters and Photometers, lenses for view angle performance measurement, and the most extensive machine vision software tool library for production-level measurement and control. We back our systems with outstanding consultative technical support, ensuring that our clients enjoy and leverage all the value built into their systems.
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TH2829A -
Changzhou Tonghui Electronic Co., Ltd.
By dint of leading impedance measurement technology and rich R&D experience, Tonghui continuously introduces representative impedance measurement product --- TH2829 series automatic component analyzer is another excellent product we have produced. TH2829A automatic component analyzer possesses a higher test speed, a more comprehensive analysis function and friendly human-computer interactive experience by adopting the latest high-speed processor and a new software system. Well-designed measuring circuit and optimized algorithms further enhance the test stability of low-D capacitance and high-Q inductors. The instrument is provided with 10V AC test level, 10V/100mA bias current and standalone 10V/50mA DC current, making it convenient for applying in the test of all kinds of active/ passive devices. Main/ sub parameters display, enhanced display system design, 150-points list sweep and graphical analysis capabilities of multiple parameters meet the most application requirements of customers.
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IBEKO Power AB
Improper functioning of battery systems installed in utilities, power plants, telecommunication systems, industrial applications and etc., can cause severe failures of the supported equipment and loss of critical information. Therefore, the battery test verifies their actual SOC (State of Charge) or SOH (State of Health) and prevents unwanted scenarios which could result in a significant budget loss as well as endanger of human lives.DV Power battery test equipment is able to perform the following battery measurements, using BLU and BVR devices:- Voltage (String and Cell)- Capacity- Temperature- Density of electrolyteAll of the above-mentioned measurements are performed with the highest accuracy. The advanced DV-B Win PC software enables collecting both numerical and graphical results. These features provide an easier and more efficient analysis. After the test, DV Win software generates a test report with a single click. A user can easily customize the report and save it in different formats, such as CLS, PDF, Word, or RTF.
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LBA Group, Inc
LBA's EMFaraCage® faraday cages are EMI and RFI shielding boxes and RF test enclosures that bring convenience to device testing. Faraday cages are ideal for isolating critical systems in high field RF environments or wherever RF ingress or egress must be minimized. Security, production testing, biomedical research and semiconductor testing are only a few of the many areas where EMFaraCage® faraday shielded enclosures are employed. EMFaraCage® faraday cage enclosure systems are fully featured to support a wide variety of test missions. The standard faraday cages include effective power, dataline and RF signal isolation in large test volumes. EMFaraCage® faraday cages are much more affordable than shielded room solutions and offer the convenience of portability.
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S-106 -
Notice
16CH WDM Mux/DeMux module of FOTS system offers a function of multiplexing or demultiplexing up to 16 channel of WDM signals. This module offers low insertion loss, low crosstalk, and high temperature stability. An internally built-in AWG module functions as 1 X N optical Multi/Demultiplexers. The bi-directional feature of this module is ideal for wide range of applications. In combination with an optionally built-in circulator or C/L-band WDM coupler, this module can be applied to the WDM-PON test. User can easily make his or her test set-ups for FTTX-PON systems, especially for WDM-PON test, by combining this module with other FOTS modules such as SLED Driver, SOA Driver, C+L-FOTS modules such as SLED Driver, SOA Driver, C+L-band ASE source, Wavelingth meter, Transceiver Driver and so on.
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Jinan Testing Equipment IE Corporation
JB-450/750A automatic type pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and is capable of doing a large number of impact tests continuously. The automatic type pendulum impact tester can display the impact power, impact toughness, and the pendulum's rotation angle. All the testing reports can be printed out. JB-450/750A can be equipped with fully automated sample feeding system, which greatly improves the test efficiency, and reduce labor intensity. The crygenic cooling device is available for impact tests under the lowest temperature down to -196 C. The automatic type pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
